Almsco.com - NEWS

TIAFT conference poster | Minimising false positive results of ‘Drugs of Abuse’

Wed, 25 Aug 2010 15:51:33 GMT

29 August 2010 - 2 September 2010
Bonn, Germany

Minimising false positive results of ‘Drugs of Abuse’ in urine samples by GC-TOF/MS and novel target identification algorithms

Petra Gerhards¹, Juergen Sawazki², Pierre Schanen¹, Gerhard Horner¹, Luzia Schaaf²

¹ ALMSCO International, Gwaun Elai Medi Science Campus, Llantrisant, RCT, CF72 8XL, United Kingdom
² Apotheke der LVR Klinik Viersen, Germany

Poster will be available for download following the conference

NEW application notes available for download

Fri, 02 Jul 2010 10:25:03 GMT

ALMSCO International has recently published several new application notes which utilise its TargetView™ software.

TargetView software has been designed by ALMSCO International to detect and identify predetermined (target) compounds within complex GC/MS (TIC) data files.

ANTV10 | Application of TargetView software within the food industry the identification of pyrazine compounds in potato crisps

ANTV11 | Automatic detection of trace target compounds in complex chemical emission profiles from products and materials

ANTV12 | Application of TargetView™ software in the fragrance industry: Accurate identification of allergens with fast GC

These can be downloaded free of charge from the application note section of this site

ALMSCO EVENTS

Thu, 01 Jul 2010 12:02:24 GMT

ALMSCO International will be participating in these forthcoming conferences and exhibitions:

Current Trends in Mass Spectrometry | Published article (May 2010)

Wed, 19 May 2010 10:07:07 GMT

TOF-MS: A Viable Solution for Crude Oil Extract Analysis

May 2010. A paper published in Advanstar Communication's publication LC-GC (Current Trends in Mass Specrometry).

The paper can be printed free of charge from the LC-GC website following the link above.

ASMS Conference, 2010 poster | Measurement of drugs of abuse (GC/TOF MS)

Tue, 04 May 2010 17:01:51 GMT

Development of a sensitive and reliable method for the measurement of drugs of abuse; comparing GC/TOF MS with GC/quadrupole MS

Petra Gerhards¹, Juergen Sawazki², Pierre Schanen¹, Gerhard Horner¹

¹ ALMSCO International, Gwaun Elai Medi Science Campus, Llantrisant, RCT, CF72 8XL, United Kingdom

² Apotheke der LVR Klinik Viersen, Germany

Poster available for download

BenchTOF-dx & TargetView technical presentations at PITTCON 2010

Mon, 08 Feb 2010 16:08:48 GMT

ALMSCO International will be exhibiting the BenchTOF-dx and TargetView at PittCon 2010 in Orlando in March (Booth 1806/1807).

Three (3) formal technical posters will be presented (copies available on request following the show):

The analysis of complex fragrance samples using a new high sensitivity bench-top time of flight mass spectrometer (BenchTOF-dx™), (G.M. Roberts, A. Cole, G. Horner and N. Bukowski - ALMSCO International) (2805-12P)
Near real-time analysis of trace level toxic chemicals using thermal desorption pre-concentration, time-of-flight mass spectrometry and novel data analysis software (G. Horner, G.M. Roberts - ALMSCO International & G. Bunte, J. Hürttlen, M. Heil - Fraunhofer ICT, Germany) (1000-7P)
Introducing a new advanced data processing software for mass spectromettry employing dynamic background compensation, spectral deconvolution and chemometric data analysis (G. M. Roberts, G. Horner, N. Bukowski - ALMSCO International) (2070-28P)

In addition to these, eight (8) application posters will be shown on the booth for the duration of the conference:

Air toxics: Analysis of urban air by TD-GC/TOF MS
Chemical emissions from construction products: Target compound location using TargetView
Beer: Flavour profiling with the BenchTOF-dx
BenchTOF-dx: A new, innovative TOF MS for GC
Food analysis using TargetView software for trace compund identification
Airborne explosives: Rapid & sensitive identification with the BenchTOF-dx time-of-flight mass spectrometer
Analysis of a crude oil fraction using GCxGC/TOF MS
Consumer beverages: Sample preparation and analysis

Press Release | New BenchTOF MS Offering Up to 100x Improved Sensitivity

Fri, 29 Jan 2010 12:59:25 GMT

ALMSCO International today announced that it will showcase its new state-of-the-art BenchTOF-dx™ mass spectrometer for the first time at PITTCON 2010. Unlike conventional technology, the new compact reflectron time-of-flight (TOF) instrument is specifically designed to generate truly classical electron impact ionization (EI) spectra for gas chromatography (GC) and comprehensive GCxGC applications. The innovative new system will be unveiled on booth 1806/1807 at PITTCON 2010, February 28 - March 5, Orlando, Florida.

The BenchTOF-dx enhances the benefits of standard TOF mass spectrometers, making it perfect for historically challenging compounds. The instrument’s breakthrough capability to generate classical spectra enables laboratories with proprietary spectral libraries to harness the performance benefits of TOF mass spectrometry while maintaining the use of their current library system.

Incorporating new groundbreaking ion optics and electronics the BenchTOF-dx delivers full spectral information at sensitivity normally only associated with the best Quadrupoles running in selected ion monitoring (SIM) mode. The rugged, low-cost, design means frequency of routine mass tuning and calibration are superior to those of standard Quadrupole systems.

BenchTOF-dx is directly compatible with industry-leading GC analytical systems. This platform-neutral instrument has been designed to easily integrate into popular mass spectrometry data analysis platforms and interface with most GC systems. This additional advantage removes the steep learning curve often associated with the implementation of a new mass spectrometry system, enabling immediate productivity improvements.

With a selectable spectral acquisition rate that exceeds 500 spectra per second, there are no GC or GCxGC separations that the system cannot accommodate. The new BenchTOF-dx is accompanied by sophisticated target search software incorporating deconvolution and chemometric analysis to facilitate rapid screening of known compounds at trace levels.

In addition to unveiling the new BenchTOF-dx mass spectrometer at PITTCON 2010, ALMSCO International will be presenting a series of informative technology posters. Topics will include ‘Introducing a New Advanced Data Processing Software for Mass Spectrometry Employing Dynamic Background Compensation, Spectral Deconvolution and Chemometric Data Analysis’ and ‘The Analysis of Complex Fragrance Samples Using a New High Sensitivity Bench Top Time of Flight Mass Spectrometer, Incorporating Online Dynamic Background Compensation, and Chemometric Data Analysis’. For a schedule of ALMSCO’s poster presentations, please email enquiries@almsco.com

BenchTOF-dx & TargetView applied to construction products & explosives analysis

Thu, 28 Jan 2010 10:58:17 GMT

HTC-11

11th International Symposium on Hyphenated Techniques in Chromatography and Hyphenated Chromatographic Analyzers

Bruges, Belgium

January 27-29, 2010

ALMSCO will be presenting two posters at the HTC-11 conference in Bruges:

TargetView™: An advanced, automated software package for the efficient detection of trace target analytes within complex GC/MS data
Thermal desorption-GC/TOF MS analysis of airborne explosives using molecular imprinted polymers (MIPS) for selective adsorption

Please contact ALMSCO for poster reprints

ALMSCO presents at the 2009 Eastern Analytical Symposium, USA

Mon, 16 Nov 2009 10:46:37 GMT

ALMSCO International will present two technical posters at the 2009 Eastern Analytical Symposium, New Jersey, USA (16-19 November, 2009)

The posters will cover applications using the TargetView software and also the BenchTOF-ds TOF MS.

Poster # 114

Introducing a New Advanced Data ProcessingSoftware for Mass Spectrometry Employing Dynamic Background Compensation, Spectral Deconvolution and Chemometric Data Analysis (Gareth M. Roberts, ALMSCO International)

Poster # 236

Introducing a New High Sensitivity Bench Top Time of Flight Mass Spectrometer (BenchTOFdx),
Incorporating On-Line Spectral Dynamic Background Compensation (DBC). (Gareth M. Roberts, ALMSCO International)

Please contact ALMSCO for poster reprints

More information on the 2009 Eastern Analytical Symposium can be found on its website

Poster presentation at Healthy Buildings 2009

Mon, 14 Sep 2009 10:03:43 GMT

Introducing a novel data processing software (TargetView™) for mass spectrometry using advanced chemometric techniques in combination with spectral deconvolution

Topics

The application of multivariate analysis to GC/MS data for target compound identification
Implementation of Dynamic Background Compensation™ (DBC™) and chemometrics within TargetView
The analysis of material emission samples (plasterboard) for target compounds within a regulated list (AgBB Germany)

For a reprint of this poster please click here