BenchTOF-dx & TargetView technical presentations at PITTCON 2010
Monday 8 February 2010 4:08 PM
 ALMSCO International will be exhibiting the BenchTOF-dx and TargetView at PittCon 2010 in Orlando in March (Booth 1806/1807).
Three (3) formal technical posters will be presented (copies available on request following the show):
- The analysis of complex fragrance samples using a new high sensitivity bench-top time of flight mass spectrometer (BenchTOF-dx™), (G.M. Roberts, A. Cole, G. Horner and N. Bukowski - ALMSCO International) (2805-12P)
- Near real-time analysis of trace level toxic chemicals using thermal desorption pre-concentration, time-of-flight mass spectrometry and novel data analysis software (G. Horner, G.M. Roberts - ALMSCO International & G. Bunte, J. Hürttlen, M. Heil - Fraunhofer ICT, Germany) (1000-7P)
- Introducing a new advanced data processing software for mass spectromettry employing dynamic background compensation, spectral deconvolution and chemometric data analysis (G. M. Roberts, G. Horner, N. Bukowski - ALMSCO International) (2070-28P)
In addition to these, eight (8) application posters will be shown on the booth for the duration of the conference:
- Air toxics: Analysis of urban air by TD-GC/TOF MS
- Chemical emissions from construction products: Target compound location using TargetView
- Beer: Flavour profiling with the BenchTOF-dx
- BenchTOF-dx: A new, innovative TOF MS for GC
- Food analysis using TargetView software for trace compund identification
- Airborne explosives: Rapid & sensitive identification with the BenchTOF-dx time-of-flight mass spectrometer
- Analysis of a crude oil fraction using GCxGC/TOF MS
- Consumer beverages: Sample preparation and analysis
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