BenchTOF-dx & TargetView technical presentations at PITTCON 2010

ALMSCO International will be exhibiting the BenchTOF-dx and TargetView at PittCon 2010 in Orlando in March (Booth 1806/1807).

Three (3) formal technical posters will be presented (copies available on request following the show):

• The analysis of complex fragrance samples using a new high sensitivity bench-top time of flight mass spectrometer (BenchTOF-dx™), (G.M. Roberts, A. Cole, G. Horner and N. Bukowski - ALMSCO International) (2805-12P)
  
  
• Near real-time analysis of trace level toxic chemicals using thermal desorption pre-concentration, time-of-flight mass spectrometry and novel data analysis software (G. Horner, G.M. Roberts - ALMSCO International & G. Bunte, J. Hürttlen, M. Heil - Fraunhofer ICT, Germany) (1000-7P) 
  
  
• Introducing a new advanced data processing software for mass spectromettry employing dynamic background compensation, spectral deconvolution and chemometric data analysis (G. M. Roberts, G. Horner, N. Bukowski - ALMSCO International) (2070-28P)

In addition to these, eight (8) application posters will be shown on the booth for the duration of the conference:

• Air toxics: Analysis of urban air by TD-GC/TOF MS
  
  
• Chemical emissions from construction products: Target compound location using TargetView
  
  
• Beer: Flavour profiling with the BenchTOF-dx
  
  
• BenchTOF-dx: A new, innovative TOF MS for GC
  
  
• Food analysis using TargetView software for trace compund identification
  
  
• Airborne explosives: Rapid & sensitive identification with the BenchTOF-dx time-of-flight mass spectrometer
  
  
• Analysis of a crude oil fraction using GCxGC/TOF MS
  
  
• Consumer beverages: Sample preparation and analysis