#Seminar: Cutting edge technology for trace compound analysis by GCxGC & GC/TOF

Friday 14 August 2009 9:06 AM

	Latest News
Press release \| High definition GC/MS technology (27/07/11) ALMSCO International posters at ASMS 2011 (2/06/11) ALMSCO to Showcase BenchTOF-dx™ Mass Spectrometer at PittCon (Booth #1322,1323) (17/02/11) Poster presentations at PittCon 2011 (25/01/11) ALMSCO to showcase TargetView software and High Definition MS at PittCon 2011 (14/01/11) Product launch \| TargetView: Target compound detection software for GC/MS (8/11/10) Current Trends in Mass Spectrometry \| Published article (Oct 2010) (20/10/10) Paper published in American Laboratory (28/09/10) TIAFT conference poster \| Minimising false positive results of ‘Drugs of Abuse’ (25/08/10) NEW application notes available for download (2/07/10)

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